a program for analyzing simultaneously C-V and G-V data from MIS structures on Si & Ge substrates
for Win32 (95/98/XP)
by George Apostolopoulos firstname.lastname@example.org
A thorough description of the model can be found at:
G. Apostolopoulos, G. Vellianitis, A. Dimoulas, J.C. Hooker, T. Conard, Appl. Phys. Lett. 84, 260 (2004)
Click here to download the program.
MISFIT simulates the capacitance and conductance versus gate voltage, measured at several frequencies, of MIS (metal-insulator-semiconductor) devices based on Si & Ge. Features of the program include:
The program has two windows: one dialog for data and command input and one output window where graphs of the measured and calculated C and G/w are shown:
Measurement data may be loaded as text files with three columns:
The simulation output and the parameters may be saved in column-format text files.